Efficient low-cost solar cells based on ITO-nSi
CZU: 621.472-022.53
Authors:
Curmei, Nicolai
Summary:
A vapor phase pyrolysis deposition (VPPD) method has been described in [1] and applied to prepare indium tin oxide (ITO) thin films with thicknesses about 400 nm, with a conductivity of 8.3 • 103 –1 cm–1, and a transparency of 80% in the visible spectral range. The layers have been deposited on the (100) surface of the n-type Si wafers with a concentration of 1015 cm–3, and their morphology has been examined. The as-deposited ITO thin films consist of crystallites with a height of 300–400 nm and a width of 100–200 nm. Properties of low-cost Cu/ITO/SiO2/n-Si/n Si/Cu solar cells fabricated by depositing ITO layers on n-Si wafers have been studied. The maximum efficiency has been found to be 13.8%.
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<meta name="citation_title" content="Efficient low-cost solar cells based on ITO-nSi "> <meta name="citation_author" content="Curmei, Nicolai"> <meta name="citation_publication_date" content="2016/06/24"> <meta name="citation_journal_title" content="Moldavian Journal of the Physical Sciences"> <meta name="citation_volume" content="15"> <meta name="citation_issue" content="1-2"> <meta name="citation_firstpage" content="76"> <meta name="citation_lastpage" content="82"> <meta name="citation_pdf_url" content="https://ibn.idsi.md/sites/default/files/imag_file/76_82_Efficient%20low-cost%20solar%20cells%20based%20on%20Ito-nSi.pdf">
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CERIF
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BibTeX
@article{ibn_48845,
author = {Curmei, N.N.},
title = {Efficient low-cost solar cells based on ITO-nSi },
journal = {Moldavian Journal of the Physical Sciences},
year = {2016},
volume = {15 (1-2)},
pages = {76-82},
month = {Jun},
abstract = {(EN) A vapor phase pyrolysis deposition (VPPD) method has been described in [1] and applied to prepare indium tin oxide (ITO) thin films with thicknesses about 400 nm, with a conductivity of 8.3 • 103 –1 cm–1, and a transparency of 80% in the visible spectral range. The layers have been deposited on the (100) surface of the n-type Si wafers with a concentration of 1015 cm–3, and their morphology has been examined. The as-deposited ITO thin films consist of crystallites with a height of 300–400 nm and a width of 100–200 nm. Properties of low-cost Cu/ITO/SiO2/n-Si/n Si/Cu solar cells fabricated by depositing ITO layers on n-Si wafers have been studied. The maximum efficiency has been found to be 13.8%. },
url = {https://ibn.idsi.md/vizualizare_articol/48845},
}
DataCite
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Dublin Core
<?xml version='1.0' encoding='utf-8'?> <oai_dc:dc xmlns:dc='http://purl.org/dc/elements/1.1/' xmlns:oai_dc='http://www.openarchives.org/OAI/2.0/oai_dc/' xmlns:xsi='http://www.w3.org/2001/XMLSchema-instance' xsi:schemaLocation='http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd'> <dc:creator>Curmei, N.N.</dc:creator> <dc:date>2016-06-24</dc:date> <dc:description xml:lang='en'>A vapor phase pyrolysis deposition (VPPD) method has been described in [1] and applied to prepare indium tin oxide (ITO) thin films with thicknesses about 400 nm, with a conductivity of 8.3 • 103 –1 cm–1, and a transparency of 80% in the visible spectral range. The layers have been deposited on the (100) surface of the n-type Si wafers with a concentration of 1015 cm–3, and their morphology has been examined. The as-deposited ITO thin films consist of crystallites with a height of 300–400 nm and a width of 100–200 nm. Properties of low-cost Cu/ITO/SiO2/n-Si/n Si/Cu solar cells fabricated by depositing ITO layers on n-Si wafers have been studied. The maximum efficiency has been found to be 13.8%. </dc:description> <dc:source>Moldavian Journal of the Physical Sciences 15 (1-2) 76-82</dc:source> <dc:title>Efficient low-cost solar cells based on ITO-nSi </dc:title> <dc:type>info:eu-repo/semantics/article</dc:type> </oai_dc:dc>