Archive: 2011 - Moldavian Journal of the Physical Sciences

05 Feb 2011

2011
V. 10
1
(p.96 - 102)

Characterization of Cu(In,Ga)Se2 thin films using reflected second harmonic generation

Authors:

Buiniţkaia, Gohvar; Culiuc, Leonid; Miroviţkii, Vadim; Mishina, E.; Şerstiuc, N.; Ramanathan, K.

Summary:

A thin film of CuInxGa(1-x)Se2 obtained by physical vapor deposition on a glass substrate covered by a Mo-film has been tested by the second harmonic generation (SHG) technique. The intensity of reflected SHG has been measured as a function of rotation angle around normal to the sample surface. To reveal the preferential orientation of micro-crystals in the film, using these data, the theoretical model of SHG in a multilayered structure has been developed. In the frame of the proposed model, the Euler angles defining the orientation of optical axis of the film texture, the ratio of two constants of nonlinear susceptibility, and the effective thickness of the film were numerically calculated.

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<meta name="citation_title" content="<p>Characterization of Cu(In,Ga)Se2 thin films using reflected second harmonic generation</p>">
<meta name="citation_author" content="Buiniţkaia, Gohvar">
<meta name="citation_author" content="Culiuc, Leonid">
<meta name="citation_author" content="Miroviţkii, Vadim">
<meta name="citation_author" content="Mishina, E.">
<meta name="citation_author" content="Şerstiuc, N.">
<meta name="citation_author" content="Ramanathan, K.">
<meta name="citation_publication_date" content="2011/02/05">
<meta name="citation_journal_title" content="Moldavian Journal of the Physical Sciences">
<meta name="citation_volume" content="10">
<meta name="citation_issue" content="1">
<meta name="citation_firstpage" content="96">
<meta name="citation_lastpage" content="102">
<meta name="citation_pdf_url" content="https://ibn.idsi.md/sites/default/files/imag_file/Characterization%20of%20Cu_In_Ga_Se2%20thin%20films%20using%20reflected%20second%20harmonic%20generation.pdf">

Crossref

<?xml version='1.0' encoding='utf-8'?>
<doi_batch version='4.3.7' xmlns='http://www.crossref.org/schema/4.3.7' xmlns:xsi='http://www.w3.org/2001/XMLSchema-instance' xsi:schemaLocation='http://www.crossref.org/schema/4.3.7 http://www.crossref.org/schema/deposit/crossref4.3.7.xsd'>
<head>
<doi_batch_id>ibn-4314</doi_batch_id>
<timestamp>1597492487</timestamp>
<depositor>
<depositor_name>Information Society Development Instiute, Republic of Moldova</depositor_name>
<email_address>mjps@nanotech.md</email_address>
</depositor>
<registrant>Institutul de Inginerie Electronică şi Nanotehnologii "D. Ghiţu" al AŞM</registrant>
</head>
<body>
<journal>
<journal_metadata>
<full_title>Moldavian Journal of the Physical Sciences</full_title>
<issn media_type='print'>1810648X</issn>
</journal_metadata>
<journal_issue>
<publication_date media_type='print'>
<year>2011</year>
</publication_date>
<issue>1(10)</issue>
</journal_issue>
<journal_article publication_type='full_text'><titles>
<title><p>Characterization of Cu(In,Ga)Se2 thin films using reflected second harmonic generation</p></title>
</titles>
<contributors>
<person_name sequence='first' contributor_role='author'>
<given_name>Gohvar</given_name>
<surname>Buiniţkaia</surname>
</person_name>
<person_name sequence='additional' contributor_role='author'>
<given_name>Leonid</given_name>
<surname>Culiuc</surname>
</person_name>
<person_name sequence='additional' contributor_role='author'>
<given_name>Vadim</given_name>
<surname>Miroviţkii</surname>
</person_name>
<person_name sequence='additional' contributor_role='author'>
<given_name>E.</given_name>
<surname>Mishina</surname>
</person_name>
<person_name sequence='additional' contributor_role='author'>
<given_name>N.</given_name>
<surname>Şerstiuc</surname>
</person_name>
<person_name sequence='additional' contributor_role='author'>
<given_name>K.</given_name>
<surname>Ramanathan</surname>
</person_name>
</contributors>
<publication_date media_type='print'>
<year>2011</year>
</publication_date>
<pages>
<first_page>96</first_page>
<last_page>102</last_page>
</pages>
</journal_article>
</journal>
</body>
</doi_batch>

CERIF

<?xml version='1.0' encoding='utf-8'?>
<CERIF xmlns='urn:xmlns:org:eurocris:cerif-1.5-1' xsi:schemaLocation='urn:xmlns:org:eurocris:cerif-1.5-1 http://www.eurocris.org/Uploads/Web%20pages/CERIF-1.5/CERIF_1.5_1.xsd' xmlns:xsi='http://www.w3.org/2001/XMLSchema-instance' release='1.5' date='2012-10-07' sourceDatabase='Output Profile'>
<cfResPubl>
<cfResPublId>ibn-ResPubl-4314</cfResPublId>
<cfResPublDate>2011-02-05</cfResPublDate>
<cfVol>10</cfVol>
<cfIssue>1</cfIssue>
<cfStartPage>96</cfStartPage>
<cfISSN>1810-648X</cfISSN>
<cfURI>http://mjps.utm.md/archive/2011/article/4314</cfURI>
<cfTitle cfLangCode='EN' cfTrans='o'><p>Characterization of Cu(In,Ga)Se2 thin films using reflected second harmonic generation</p></cfTitle>
<cfAbstr cfLangCode='EN' cfTrans='o'>A  thin  film of  CuInxGa(1-x)Se2 obtained by physical vapor deposition on a glass  substrate 
covered by a Mo-film has been tested by the second harmonic generation (SHG) technique. The 
intensity of  reflected SHG has been measured as a  function of  rotation angle around normal  to 
the  sample  surface.  To  reveal  the  preferential  orientation  of micro-crystals  in  the  film,  using these data,  the  theoretical model of SHG  in a multilayered structure has been developed.  In  the 
frame of the proposed model, the Euler angles defining the orientation of optical axis of the film 
texture,  the  ratio of  two constants of nonlinear susceptibility, and  the effective  thickness of  the 

film were numerically calculated. </cfAbstr>
<cfResPubl_Class>
<cfClassId>eda2d9e9-34c5-11e1-b86c-0800200c9a66</cfClassId>
<cfClassSchemeId>759af938-34ae-11e1-b86c-0800200c9a66</cfClassSchemeId>
<cfStartDate>2011-02-05T24:00:00</cfStartDate>
</cfResPubl_Class>
<cfResPubl_Class>
<cfClassId>e601872f-4b7e-4d88-929f-7df027b226c9</cfClassId>
<cfClassSchemeId>40e90e2f-446d-460a-98e5-5dce57550c48</cfClassSchemeId>
<cfStartDate>2011-02-05T24:00:00</cfStartDate>
</cfResPubl_Class>
<cfPers_ResPubl>
<cfPersId>ibn-person-38876</cfPersId>
<cfClassId>49815870-1cfe-11e1-8bc2-0800200c9a66</cfClassId>
<cfClassSchemeId>b7135ad0-1d00-11e1-8bc2-0800200c9a66</cfClassSchemeId>
<cfStartDate>2011-02-05T24:00:00</cfStartDate>
</cfPers_ResPubl>
<cfPers_ResPubl>
<cfPersId>ibn-person-17591</cfPersId>
<cfClassId>49815870-1cfe-11e1-8bc2-0800200c9a66</cfClassId>
<cfClassSchemeId>b7135ad0-1d00-11e1-8bc2-0800200c9a66</cfClassSchemeId>
<cfStartDate>2011-02-05T24:00:00</cfStartDate>
</cfPers_ResPubl>
<cfPers_ResPubl>
<cfPersId>ibn-person-1043</cfPersId>
<cfClassId>49815870-1cfe-11e1-8bc2-0800200c9a66</cfClassId>
<cfClassSchemeId>b7135ad0-1d00-11e1-8bc2-0800200c9a66</cfClassSchemeId>
<cfStartDate>2011-02-05T24:00:00</cfStartDate>
</cfPers_ResPubl>
<cfPers_ResPubl>
<cfPersId>ibn-person-56515</cfPersId>
<cfClassId>49815870-1cfe-11e1-8bc2-0800200c9a66</cfClassId>
<cfClassSchemeId>b7135ad0-1d00-11e1-8bc2-0800200c9a66</cfClassSchemeId>
<cfStartDate>2011-02-05T24:00:00</cfStartDate>
</cfPers_ResPubl>
<cfPers_ResPubl>
<cfPersId>ibn-person-22021</cfPersId>
<cfClassId>49815870-1cfe-11e1-8bc2-0800200c9a66</cfClassId>
<cfClassSchemeId>b7135ad0-1d00-11e1-8bc2-0800200c9a66</cfClassSchemeId>
<cfStartDate>2011-02-05T24:00:00</cfStartDate>
</cfPers_ResPubl>
<cfPers_ResPubl>
<cfPersId>ibn-person-79175</cfPersId>
<cfClassId>49815870-1cfe-11e1-8bc2-0800200c9a66</cfClassId>
<cfClassSchemeId>b7135ad0-1d00-11e1-8bc2-0800200c9a66</cfClassSchemeId>
<cfStartDate>2011-02-05T24:00:00</cfStartDate>
</cfPers_ResPubl>
</cfResPubl>
<cfPers>
<cfPersId>ibn-Pers-38876</cfPersId>
<cfPersName_Pers>
<cfPersNameId>ibn-PersName-38876-3</cfPersNameId>
<cfClassId>55f90543-d631-42eb-8d47-d8d9266cbb26</cfClassId>
<cfClassSchemeId>7375609d-cfa6-45ce-a803-75de69abe21f</cfClassSchemeId>
<cfStartDate>2011-02-05T24:00:00</cfStartDate>
<cfFamilyNames>Buinitskaya</cfFamilyNames>
<cfFirstNames>G.</cfFirstNames>
</cfPersName_Pers>
</cfPers>
<cfPers>
<cfPersId>ibn-Pers-17591</cfPersId>
<cfPersName_Pers>
<cfPersNameId>ibn-PersName-17591-3</cfPersNameId>
<cfClassId>55f90543-d631-42eb-8d47-d8d9266cbb26</cfClassId>
<cfClassSchemeId>7375609d-cfa6-45ce-a803-75de69abe21f</cfClassSchemeId>
<cfStartDate>2011-02-05T24:00:00</cfStartDate>
<cfFamilyNames>Kulyuk</cfFamilyNames>
<cfFirstNames>Leonid</cfFirstNames>
</cfPersName_Pers>
</cfPers>
<cfPers>
<cfPersId>ibn-Pers-1043</cfPersId>
<cfPersName_Pers>
<cfPersNameId>ibn-PersName-1043-3</cfPersNameId>
<cfClassId>55f90543-d631-42eb-8d47-d8d9266cbb26</cfClassId>
<cfClassSchemeId>7375609d-cfa6-45ce-a803-75de69abe21f</cfClassSchemeId>
<cfStartDate>2011-02-05T24:00:00</cfStartDate>
<cfFamilyNames>Miroviţkii</cfFamilyNames>
<cfFirstNames>Vadim</cfFirstNames>
</cfPersName_Pers>
</cfPers>
<cfPers>
<cfPersId>ibn-Pers-56515</cfPersId>
<cfPersName_Pers>
<cfPersNameId>ibn-PersName-56515-3</cfPersNameId>
<cfClassId>55f90543-d631-42eb-8d47-d8d9266cbb26</cfClassId>
<cfClassSchemeId>7375609d-cfa6-45ce-a803-75de69abe21f</cfClassSchemeId>
<cfStartDate>2011-02-05T24:00:00</cfStartDate>
<cfFamilyNames>Mishina</cfFamilyNames>
<cfFirstNames>E.</cfFirstNames>
</cfPersName_Pers>
</cfPers>
<cfPers>
<cfPersId>ibn-Pers-22021</cfPersId>
<cfPersName_Pers>
<cfPersNameId>ibn-PersName-22021-3</cfPersNameId>
<cfClassId>55f90543-d631-42eb-8d47-d8d9266cbb26</cfClassId>
<cfClassSchemeId>7375609d-cfa6-45ce-a803-75de69abe21f</cfClassSchemeId>
<cfStartDate>2011-02-05T24:00:00</cfStartDate>
<cfFamilyNames>Sherstyuk</cfFamilyNames>
<cfFirstNames>N.</cfFirstNames>
</cfPersName_Pers>
</cfPers>
<cfPers>
<cfPersId>ibn-Pers-79175</cfPersId>
<cfPersName_Pers>
<cfPersNameId>ibn-PersName-79175-3</cfPersNameId>
<cfClassId>55f90543-d631-42eb-8d47-d8d9266cbb26</cfClassId>
<cfClassSchemeId>7375609d-cfa6-45ce-a803-75de69abe21f</cfClassSchemeId>
<cfStartDate>2011-02-05T24:00:00</cfStartDate>
<cfFamilyNames>Ramanathan</cfFamilyNames>
<cfFirstNames>K.</cfFirstNames>
</cfPersName_Pers>
</cfPers>
</CERIF>

BibTeX

@article{ibn_4314,
author = {Buiniţkaia, G. and Culiuc, L.L. and Miroviţkii, V.I. and Mishina, E.D. and Şerstiuc, N.E. and Ramanathan, K.},
title = {<p>Characterization of Cu(In,Ga)Se2 thin films using reflected second harmonic generation</p>},
journal = {Moldavian Journal of the Physical Sciences},
year = {2011},
volume = {10 (1)},
pages = {96-102},
month = {Feb},
abstract = {(EN) A  thin  film of  CuInxGa(1-x)Se2 obtained by physical vapor deposition on a glass  substrate 
covered by a Mo-film has been tested by the second harmonic generation (SHG) technique. The 
intensity of  reflected SHG has been measured as a  function of  rotation angle around normal  to 
the  sample  surface.  To  reveal  the  preferential  orientation  of micro-crystals  in  the  film,  using these data,  the  theoretical model of SHG  in a multilayered structure has been developed.  In  the 
frame of the proposed model, the Euler angles defining the orientation of optical axis of the film 
texture,  the  ratio of  two constants of nonlinear susceptibility, and  the effective  thickness of  the 

film were numerically calculated. },
url = {https://ibn.idsi.md/vizualizare_articol/4314},
}

DataCite

<?xml version='1.0' encoding='utf-8'?>
<resource xmlns:xsi='http://www.w3.org/2001/XMLSchema-instance' xmlns='http://datacite.org/schema/kernel-3' xsi:schemaLocation='http://datacite.org/schema/kernel-3 http://schema.datacite.org/meta/kernel-3/metadata.xsd'>
<creators>
<creator>
<creatorName>Buiniţkaia, G.</creatorName>
<affiliation>Institutul de Fizică Aplicată al AŞM, Moldova, Republica</affiliation>
</creator>
<creator>
<creatorName>Culiuc, L.L.</creatorName>
<affiliation>Institutul de Fizică Aplicată al AŞM, Moldova, Republica</affiliation>
</creator>
<creator>
<creatorName>Miroviţkii, V.I.</creatorName>
<affiliation>Institutul de Fizică Aplicată al AŞM, Moldova, Republica</affiliation>
</creator>
<creator>
<creatorName>Mishina, E.D.</creatorName>
<affiliation>Moscow Technological University (MIREA), Rusia</affiliation>
</creator>
<creator>
<creatorName>Şerstiuc, N.E.</creatorName>
<affiliation>Moscow Technological University (MIREA), Rusia</affiliation>
</creator>
<creator>
<creatorName>Ramanathan, K.</creatorName>
<affiliation>National Center for Photovoltaics, Statele Unite ale Americii</affiliation>
</creator>
</creators>
<titles>
<title xml:lang='en'><p>Characterization of Cu(In,Ga)Se2 thin films using reflected second harmonic generation</p></title>
</titles>
<publisher>Instrumentul Bibliometric National</publisher>
<publicationYear>2011</publicationYear>
<relatedIdentifier relatedIdentifierType='ISSN' relationType='IsPartOf'>1810-648X</relatedIdentifier>
<dates>
<date dateType='Issued'>2011-02-05</date>
</dates>
<resourceType resourceTypeGeneral='Text'>Journal article</resourceType>
<descriptions>
<description xml:lang='en' descriptionType='Abstract'>A  thin  film of  CuInxGa(1-x)Se2 obtained by physical vapor deposition on a glass  substrate 
covered by a Mo-film has been tested by the second harmonic generation (SHG) technique. The 
intensity of  reflected SHG has been measured as a  function of  rotation angle around normal  to 
the  sample  surface.  To  reveal  the  preferential  orientation  of micro-crystals  in  the  film,  using these data,  the  theoretical model of SHG  in a multilayered structure has been developed.  In  the 
frame of the proposed model, the Euler angles defining the orientation of optical axis of the film 
texture,  the  ratio of  two constants of nonlinear susceptibility, and  the effective  thickness of  the 

film were numerically calculated. </description>
</descriptions>
<formats>
<format>application/pdf</format>
</formats>
</resource>

Dublin Core

<?xml version='1.0' encoding='utf-8'?>
<oai_dc:dc xmlns:dc='http://purl.org/dc/elements/1.1/' xmlns:oai_dc='http://www.openarchives.org/OAI/2.0/oai_dc/' xmlns:xsi='http://www.w3.org/2001/XMLSchema-instance' xsi:schemaLocation='http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd'>
<dc:creator>Buiniţkaia, G.</dc:creator>
<dc:creator>Culiuc, L.L.</dc:creator>
<dc:creator>Miroviţkii, V.I.</dc:creator>
<dc:creator>Mishina, E.D.</dc:creator>
<dc:creator>Şerstiuc, N.E.</dc:creator>
<dc:creator>Ramanathan, K.</dc:creator>
<dc:date>2011-02-05</dc:date>
<dc:description xml:lang='en'>A  thin  film of  CuInxGa(1-x)Se2 obtained by physical vapor deposition on a glass  substrate 
covered by a Mo-film has been tested by the second harmonic generation (SHG) technique. The 
intensity of  reflected SHG has been measured as a  function of  rotation angle around normal  to 
the  sample  surface.  To  reveal  the  preferential  orientation  of micro-crystals  in  the  film,  using these data,  the  theoretical model of SHG  in a multilayered structure has been developed.  In  the 
frame of the proposed model, the Euler angles defining the orientation of optical axis of the film 
texture,  the  ratio of  two constants of nonlinear susceptibility, and  the effective  thickness of  the 

film were numerically calculated. </dc:description>
<dc:source>Moldavian Journal of the Physical Sciences 10 (1) 96-102</dc:source>
<dc:title><p>Characterization of Cu(In,Ga)Se2 thin films using reflected second harmonic generation</p></dc:title>
<dc:type>info:eu-repo/semantics/article</dc:type>
</oai_dc:dc>

“ ... ”

SM ISO690:2012

BUINITSKAYA, G.; KULYUK, Leonid; MIROVIŢKII, Vadim; MISHINA, E.; SHERSTYUK, N.; RAMANATHAN, K.. Characterization of Cu(In,Ga)Se2 thin films using reflected second harmonic generation. In: Moldavian Journal of the Physical Sciences. 2011, nr. 1(10), pp. 96-102. ISSN 1810-648X.