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  • Archive: 2009
05 May 2009
  • 2009
  • V. 8
  • 2
  • (p.201 - 206)

Focused ion beam treatment of ZnO nanowires

Authors:

Shmavonyan, G.

Summary:

We investigated vapour-liquid-solid (VLS)-grown ZnO nanowires (NWs) on a Si sub- strate by scanning electron microscopy (SEM). Nanowires are found in a variety of shapes, surface properties and features, but seem to be all homogeneous inside. Darkish spots and areas on the surface are easily removed by a “gentle” focused ion beam (FIB) treatment. To unveil their deeper interior, we also applied FIB treatment. An overview of our results (SEM images) is given in this paper.

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BibTeX

@article{ibn_4113,
author = {Shmavonyan, G.S.},
title = {Focused ion beam treatment of ZnO nanowires },
journal = {Moldavian Journal of the Physical Sciences},
year = {2009},
volume = {8 (2)},
pages = {201-206},
month = {May},
abstract = {(EN) We investigated vapour-liquid-solid (VLS)-grown ZnO nanowires (NWs) on a Si sub-

strate by scanning electron microscopy (SEM). Nanowires are found in a variety of shapes, 
surface properties and features, but seem to be all homogeneous inside. Darkish spots and 
areas on the surface are easily removed by a “gentle” focused ion beam (FIB) treatment. To 
unveil their deeper interior, we also applied FIB treatment. An overview of our results (SEM 
images) is given in this paper. 

 },
url = {https://ibn.idsi.md/vizualizare_articol/4113},
}

DataCite

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surface properties and features, but seem to be all homogeneous inside. Darkish spots and 
areas on the surface are easily removed by a “gentle” focused ion beam (FIB) treatment. To 
unveil their deeper interior, we also applied FIB treatment. An overview of our results (SEM 
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Dublin Core

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<dc:creator>Shmavonyan, G.S.</dc:creator>
<dc:date>2009-05-05</dc:date>
<dc:description xml:lang='en'>We investigated vapour-liquid-solid (VLS)-grown ZnO nanowires (NWs) on a Si sub-

strate by scanning electron microscopy (SEM). Nanowires are found in a variety of shapes, 
surface properties and features, but seem to be all homogeneous inside. Darkish spots and 
areas on the surface are easily removed by a “gentle” focused ion beam (FIB) treatment. To 
unveil their deeper interior, we also applied FIB treatment. An overview of our results (SEM 
images) is given in this paper. 

 </dc:description>
<dc:source>Moldavian Journal of the Physical Sciences 8 (2) 201-206</dc:source>
<dc:title>Focused ion beam treatment of ZnO nanowires </dc:title>
<dc:type>info:eu-repo/semantics/article</dc:type>
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SM ISO690:2012

SHMAVONYAN, G.. Focused ion beam treatment of ZnO nanowires . In: Moldavian Journal of the Physical Sciences. 2009, nr. 2(8), pp. 201-206. ISSN 1810-648X.

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