Nanoindentation response of semiconductors
Authors:
LeBourhis, E.; Patriarche, G.
Summary:
The paper reviews the nanoindentation behaviour of semiconductors under concentrated
load. We consider first, fundamental aspects regarding the mechanical resistance to contact
loading of semiconductor single crystals (indentation strain, hardness-yield stress relationship). Then, the paper summarizes recent studies regarding nanoindentation structure and
geometrical size effect.
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<meta name="citation_title" content="Nanoindentation response of semiconductors"> <meta name="citation_author" content="LeBourhis, E."> <meta name="citation_author" content="Patriarche, G."> <meta name="citation_publication_date" content="2008/10/05"> <meta name="citation_journal_title" content="Moldavian Journal of the Physical Sciences"> <meta name="citation_volume" content="7"> <meta name="citation_issue" content="4"> <meta name="citation_firstpage" content="456"> <meta name="citation_lastpage" content="465"> <meta name="citation_pdf_url" content="https://ibn.idsi.md/sites/default/files/imag_file/Nanoindentation-response-of-semiconductors.pdf">
Crossref
<?xml version='1.0' encoding='utf-8'?> <doi_batch version='4.3.7' xmlns='http://www.crossref.org/schema/4.3.7' xmlns:xsi='http://www.w3.org/2001/XMLSchema-instance' xsi:schemaLocation='http://www.crossref.org/schema/4.3.7 http://www.crossref.org/schema/deposit/crossref4.3.7.xsd'> <head> <doi_batch_id>ibn-3945</doi_batch_id> <timestamp>1597496022</timestamp> <depositor> <depositor_name>Information Society Development Instiute, Republic of Moldova</depositor_name> <email_address>mjps@nanotech.md</email_address> </depositor> <registrant>Institutul de Inginerie Electronică şi Nanotehnologii "D. Ghiţu" al AŞM</registrant> </head> <body> <journal> <journal_metadata> <full_title>Moldavian Journal of the Physical Sciences</full_title> <issn media_type='print'>1810648X</issn> </journal_metadata> <journal_issue> <publication_date media_type='print'> <year>2008</year> </publication_date> <issue>4(7)</issue> </journal_issue> <journal_article publication_type='full_text'><titles> <title>Nanoindentation response of semiconductors</title> </titles> <contributors> <person_name sequence='first' contributor_role='author'> <given_name>E.</given_name> <surname>LeBourhis</surname> </person_name> <person_name sequence='additional' contributor_role='author'> <given_name>G.</given_name> <surname>Patriarche</surname> </person_name> </contributors> <publication_date media_type='print'> <year>2008</year> </publication_date> <pages> <first_page>456</first_page> <last_page>465</last_page> </pages> </journal_article> </journal> </body> </doi_batch>
CERIF
<?xml version='1.0' encoding='utf-8'?> <CERIF xmlns='urn:xmlns:org:eurocris:cerif-1.5-1' xsi:schemaLocation='urn:xmlns:org:eurocris:cerif-1.5-1 http://www.eurocris.org/Uploads/Web%20pages/CERIF-1.5/CERIF_1.5_1.xsd' xmlns:xsi='http://www.w3.org/2001/XMLSchema-instance' release='1.5' date='2012-10-07' sourceDatabase='Output Profile'> <cfResPubl> <cfResPublId>ibn-ResPubl-3945</cfResPublId> <cfResPublDate>2008-10-05</cfResPublDate> <cfVol>7</cfVol> <cfIssue>4</cfIssue> <cfStartPage>456</cfStartPage> <cfISSN>1810-648X</cfISSN> <cfURI>http://mjps.utm.md/archive/2008/article/3945</cfURI> <cfTitle cfLangCode='RO' cfTrans='o'>Nanoindentation response of semiconductors</cfTitle> <cfAbstr cfLangCode='EN' cfTrans='o'>The paper reviews the nanoindentation behaviour of semiconductors under concentrated load. We consider first, fundamental aspects regarding the mechanical resistance to contact loading of semiconductor single crystals (indentation strain, hardness-yield stress relationship). Then, the paper summarizes recent studies regarding nanoindentation structure and geometrical size effect. </cfAbstr> <cfResPubl_Class> <cfClassId>eda2d9e9-34c5-11e1-b86c-0800200c9a66</cfClassId> <cfClassSchemeId>759af938-34ae-11e1-b86c-0800200c9a66</cfClassSchemeId> <cfStartDate>2008-10-05T24:00:00</cfStartDate> </cfResPubl_Class> <cfResPubl_Class> <cfClassId>e601872f-4b7e-4d88-929f-7df027b226c9</cfClassId> <cfClassSchemeId>40e90e2f-446d-460a-98e5-5dce57550c48</cfClassSchemeId> <cfStartDate>2008-10-05T24:00:00</cfStartDate> </cfResPubl_Class> <cfPers_ResPubl> <cfPersId>ibn-person-35213</cfPersId> <cfClassId>49815870-1cfe-11e1-8bc2-0800200c9a66</cfClassId> <cfClassSchemeId>b7135ad0-1d00-11e1-8bc2-0800200c9a66</cfClassSchemeId> <cfStartDate>2008-10-05T24:00:00</cfStartDate> </cfPers_ResPubl> <cfPers_ResPubl> <cfPersId>ibn-person-35214</cfPersId> <cfClassId>49815870-1cfe-11e1-8bc2-0800200c9a66</cfClassId> <cfClassSchemeId>b7135ad0-1d00-11e1-8bc2-0800200c9a66</cfClassSchemeId> <cfStartDate>2008-10-05T24:00:00</cfStartDate> </cfPers_ResPubl> </cfResPubl> <cfPers> <cfPersId>ibn-Pers-35213</cfPersId> <cfPersName_Pers> <cfPersNameId>ibn-PersName-35213-2</cfPersNameId> <cfClassId>55f90543-d631-42eb-8d47-d8d9266cbb26</cfClassId> <cfClassSchemeId>7375609d-cfa6-45ce-a803-75de69abe21f</cfClassSchemeId> <cfStartDate>2008-10-05T24:00:00</cfStartDate> <cfFamilyNames>LeBourhis</cfFamilyNames> <cfFirstNames>E.</cfFirstNames> </cfPersName_Pers> </cfPers> <cfPers> <cfPersId>ibn-Pers-35214</cfPersId> <cfPersName_Pers> <cfPersNameId>ibn-PersName-35214-2</cfPersNameId> <cfClassId>55f90543-d631-42eb-8d47-d8d9266cbb26</cfClassId> <cfClassSchemeId>7375609d-cfa6-45ce-a803-75de69abe21f</cfClassSchemeId> <cfStartDate>2008-10-05T24:00:00</cfStartDate> <cfFamilyNames>Patriarche</cfFamilyNames> <cfFirstNames>G.</cfFirstNames> </cfPersName_Pers> </cfPers> </CERIF>
BibTeX
@article{ibn_3945,
author = {LeBourhis, E. and Patriarche, G.},
title = {Nanoindentation response of semiconductors},
journal = {Moldavian Journal of the Physical Sciences},
year = {2008},
volume = {7 (4)},
pages = {456-465},
month = {Oct},
abstract = {(EN) The paper reviews the nanoindentation behaviour of semiconductors under concentrated
load. We consider first, fundamental aspects regarding the mechanical resistance to contact
loading of semiconductor single crystals (indentation strain, hardness-yield stress relationship). Then, the paper summarizes recent studies regarding nanoindentation structure and
geometrical size effect.
},
url = {https://ibn.idsi.md/vizualizare_articol/3945},
}
DataCite
<?xml version='1.0' encoding='utf-8'?> <resource xmlns:xsi='http://www.w3.org/2001/XMLSchema-instance' xmlns='http://datacite.org/schema/kernel-3' xsi:schemaLocation='http://datacite.org/schema/kernel-3 http://schema.datacite.org/meta/kernel-3/metadata.xsd'> <creators> <creator> <creatorName>LeBourhis, E.</creatorName> </creator> <creator> <creatorName>Patriarche, G.</creatorName> </creator> </creators> <titles> <title xml:lang='ro'>Nanoindentation response of semiconductors</title> </titles> <publisher>Instrumentul Bibliometric National</publisher> <publicationYear>2008</publicationYear> <relatedIdentifier relatedIdentifierType='ISSN' relationType='IsPartOf'>1810-648X</relatedIdentifier> <dates> <date dateType='Issued'>2008-10-05</date> </dates> <resourceType resourceTypeGeneral='Text'>Journal article</resourceType> <descriptions> <description xml:lang='en' descriptionType='Abstract'>The paper reviews the nanoindentation behaviour of semiconductors under concentrated load. We consider first, fundamental aspects regarding the mechanical resistance to contact loading of semiconductor single crystals (indentation strain, hardness-yield stress relationship). Then, the paper summarizes recent studies regarding nanoindentation structure and geometrical size effect. </description> </descriptions> <formats> <format>application/pdf</format> </formats> </resource>
Dublin Core
<?xml version='1.0' encoding='utf-8'?> <oai_dc:dc xmlns:dc='http://purl.org/dc/elements/1.1/' xmlns:oai_dc='http://www.openarchives.org/OAI/2.0/oai_dc/' xmlns:xsi='http://www.w3.org/2001/XMLSchema-instance' xsi:schemaLocation='http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd'> <dc:creator>LeBourhis, E.</dc:creator> <dc:creator>Patriarche, G.</dc:creator> <dc:date>2008-10-05</dc:date> <dc:description xml:lang='en'>The paper reviews the nanoindentation behaviour of semiconductors under concentrated load. We consider first, fundamental aspects regarding the mechanical resistance to contact loading of semiconductor single crystals (indentation strain, hardness-yield stress relationship). Then, the paper summarizes recent studies regarding nanoindentation structure and geometrical size effect. </dc:description> <dc:source>Moldavian Journal of the Physical Sciences 7 (4) 456-465</dc:source> <dc:title>Nanoindentation response of semiconductors</dc:title> <dc:type>info:eu-repo/semantics/article</dc:type> </oai_dc:dc>