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  • Archive: 2006
05 Dec 2006
  • 2006
  • V. 5
  • 3-4
  • (p.360 - 365)

HTSC – Si and HTSC – InSb contacts for diode detectors: comparison of characteristics

Authors:

Cherner, Iacov

Summary:

The numerical calculations of the electrical potential distribution and current passing in the contacts of the high temperature superconductor (HTSC) with semiconductors silicon (Si) and indium antimonite (InSb) were carried out. There were analyzed the possibilities to prepare the diode detectors (DD) based on these contacts and working at liquid nitrogen temperature 77.4K. The comparison of structures based on Si and InSb was carried out. The obtained results were explained taking into account the physical properties of these semiconductors. Both advantages and disadvantages of these materials were discussed. The optimum application spheres were determined for Si and InSb accordingly. The comparison of the obtained results with existent literature data shows that the proposed DD can be 10÷100 times better than the existing devices. Therefore, these DD are perspective for cryogenic electronics, and their preparation is a problem of today.

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<meta name="citation_title" content="HTSC – Si and HTSC – InSb contacts for diode detectors: comparison of characteristics 
">
<meta name="citation_author" content="Cherner, Iacov">
<meta name="citation_publication_date" content="2006/12/05">
<meta name="citation_journal_title" content="Moldavian Journal of the Physical Sciences">
<meta name="citation_volume" content="5">
<meta name="citation_issue" content="3-4">
<meta name="citation_firstpage" content="360">
<meta name="citation_lastpage" content="365">
<meta name="citation_pdf_url" content="https://ibn.idsi.md/sites/default/files/imag_file/HTSC_%20Si%20and%20HTSC_%20InSb%20contacts%20for%20diode%20detectors.pdf">

Crossref

<?xml version='1.0' encoding='utf-8'?>
<doi_batch version='4.3.7' xmlns='http://www.crossref.org/schema/4.3.7' xmlns:xsi='http://www.w3.org/2001/XMLSchema-instance' xsi:schemaLocation='http://www.crossref.org/schema/4.3.7 http://www.crossref.org/schema/deposit/crossref4.3.7.xsd'>
<head>
<doi_batch_id>ibn-3599</doi_batch_id>
<timestamp>1597499012</timestamp>
<depositor>
<depositor_name>Information Society Development Instiute, Republic of Moldova</depositor_name>
<email_address>mjps@nanotech.md</email_address>
</depositor>
<registrant>Institutul de Inginerie Electronică şi Nanotehnologii "D. Ghiţu" al AŞM</registrant>
</head>
<body>
<journal>
<journal_metadata>
<full_title>Moldavian Journal of the Physical Sciences</full_title>
<issn media_type='print'>1810648X</issn>
</journal_metadata>
<journal_issue>
<publication_date media_type='print'>
<year>2006</year>
</publication_date>
<issue>3-4(5)</issue>
</journal_issue>
<journal_article publication_type='full_text'><titles>
<title>HTSC – Si and HTSC – InSb contacts for diode detectors: comparison of characteristics 
</title>
</titles>
<contributors>
<person_name sequence='first' contributor_role='author'>
<given_name>Iacov</given_name>
<surname>Cherner</surname>
</person_name>
</contributors>
<publication_date media_type='print'>
<year>2006</year>
</publication_date>
<pages>
<first_page>360</first_page>
<last_page>365</last_page>
</pages>
</journal_article>
</journal>
</body>
</doi_batch>

CERIF

<?xml version='1.0' encoding='utf-8'?>
<CERIF xmlns='urn:xmlns:org:eurocris:cerif-1.5-1' xsi:schemaLocation='urn:xmlns:org:eurocris:cerif-1.5-1 http://www.eurocris.org/Uploads/Web%20pages/CERIF-1.5/CERIF_1.5_1.xsd' xmlns:xsi='http://www.w3.org/2001/XMLSchema-instance' release='1.5' date='2012-10-07' sourceDatabase='Output Profile'>
<cfResPubl>
<cfResPublId>ibn-ResPubl-3599</cfResPublId>
<cfResPublDate>2006-12-05</cfResPublDate>
<cfVol>5</cfVol>
<cfIssue>3-4</cfIssue>
<cfStartPage>360</cfStartPage>
<cfISSN>1810-648X</cfISSN>
<cfURI>http://mjps.utm.md/archive/2006/article/3599</cfURI>
<cfTitle cfLangCode='RO' cfTrans='o'>HTSC – Si and HTSC – InSb contacts for diode detectors: comparison of characteristics 
</cfTitle>
<cfAbstr cfLangCode='EN' cfTrans='o'>The numerical calculations of the electrical potential distribution and current passing in 

the contacts of the high temperature superconductor (HTSC) with semiconductors silicon (Si) 
and indium antimonite (InSb) were carried out. There were analyzed the possibilities to prepare the diode detectors (DD) based on these contacts and working at liquid nitrogen temperature 77.4K.  
The comparison of structures based on Si and InSb was carried out. The obtained results 
were explained taking into account the physical properties of these semiconductors. Both advantages and disadvantages of these materials were discussed. The optimum application 
spheres were determined for Si and InSb accordingly.  
The comparison of the obtained results with existent literature data shows that the proposed DD can be 10÷100 times better than the existing devices. Therefore, these DD are perspective for cryogenic electronics, and their preparation is a problem of today.  
</cfAbstr>
<cfResPubl_Class>
<cfClassId>eda2d9e9-34c5-11e1-b86c-0800200c9a66</cfClassId>
<cfClassSchemeId>759af938-34ae-11e1-b86c-0800200c9a66</cfClassSchemeId>
<cfStartDate>2006-12-05T24:00:00</cfStartDate>
</cfResPubl_Class>
<cfResPubl_Class>
<cfClassId>e601872f-4b7e-4d88-929f-7df027b226c9</cfClassId>
<cfClassSchemeId>40e90e2f-446d-460a-98e5-5dce57550c48</cfClassSchemeId>
<cfStartDate>2006-12-05T24:00:00</cfStartDate>
</cfResPubl_Class>
<cfPers_ResPubl>
<cfPersId>ibn-person-1030</cfPersId>
<cfClassId>49815870-1cfe-11e1-8bc2-0800200c9a66</cfClassId>
<cfClassSchemeId>b7135ad0-1d00-11e1-8bc2-0800200c9a66</cfClassSchemeId>
<cfStartDate>2006-12-05T24:00:00</cfStartDate>
</cfPers_ResPubl>
</cfResPubl>
<cfPers>
<cfPersId>ibn-Pers-1030</cfPersId>
<cfPersName_Pers>
<cfPersNameId>ibn-PersName-1030-2</cfPersNameId>
<cfClassId>55f90543-d631-42eb-8d47-d8d9266cbb26</cfClassId>
<cfClassSchemeId>7375609d-cfa6-45ce-a803-75de69abe21f</cfClassSchemeId>
<cfStartDate>2006-12-05T24:00:00</cfStartDate>
<cfFamilyNames>Kerner</cfFamilyNames>
<cfFirstNames>Iacov</cfFirstNames>
</cfPersName_Pers>
</cfPers>
</CERIF>

BibTeX

@article{ibn_3599,
author = {Cherner, I.I.},
title = {HTSC – Si and HTSC – InSb contacts for diode detectors: comparison of characteristics 
},
journal = {Moldavian Journal of the Physical Sciences},
year = {2006},
volume = {5 (3-4)},
pages = {360-365},
month = {Dec},
abstract = {(EN) The numerical calculations of the electrical potential distribution and current passing in 

the contacts of the high temperature superconductor (HTSC) with semiconductors silicon (Si) 
and indium antimonite (InSb) were carried out. There were analyzed the possibilities to prepare the diode detectors (DD) based on these contacts and working at liquid nitrogen temperature 77.4K.  
The comparison of structures based on Si and InSb was carried out. The obtained results 
were explained taking into account the physical properties of these semiconductors. Both advantages and disadvantages of these materials were discussed. The optimum application 
spheres were determined for Si and InSb accordingly.  
The comparison of the obtained results with existent literature data shows that the proposed DD can be 10÷100 times better than the existing devices. Therefore, these DD are perspective for cryogenic electronics, and their preparation is a problem of today.  
},
url = {https://ibn.idsi.md/vizualizare_articol/3599},
}

DataCite

<?xml version='1.0' encoding='utf-8'?>
<resource xmlns:xsi='http://www.w3.org/2001/XMLSchema-instance' xmlns='http://datacite.org/schema/kernel-3' xsi:schemaLocation='http://datacite.org/schema/kernel-3 http://schema.datacite.org/meta/kernel-3/metadata.xsd'>
<creators>
<creator>
<creatorName>Cherner, I.I.</creatorName>
<affiliation>Institutul de Inginerie Electronică şi Nanotehnologii "D. Ghiţu" al AŞM, Moldova, Republica</affiliation>
</creator>
</creators>
<titles>
<title xml:lang='ro'>HTSC – Si and HTSC – InSb contacts for diode detectors: comparison of characteristics 
</title>
</titles>
<publisher>Instrumentul Bibliometric National</publisher>
<publicationYear>2006</publicationYear>
<relatedIdentifier relatedIdentifierType='ISSN' relationType='IsPartOf'>1810-648X</relatedIdentifier>
<dates>
<date dateType='Issued'>2006-12-05</date>
</dates>
<resourceType resourceTypeGeneral='Text'>Journal article</resourceType>
<descriptions>
<description xml:lang='en' descriptionType='Abstract'>The numerical calculations of the electrical potential distribution and current passing in 

the contacts of the high temperature superconductor (HTSC) with semiconductors silicon (Si) 
and indium antimonite (InSb) were carried out. There were analyzed the possibilities to prepare the diode detectors (DD) based on these contacts and working at liquid nitrogen temperature 77.4K.  
The comparison of structures based on Si and InSb was carried out. The obtained results 
were explained taking into account the physical properties of these semiconductors. Both advantages and disadvantages of these materials were discussed. The optimum application 
spheres were determined for Si and InSb accordingly.  
The comparison of the obtained results with existent literature data shows that the proposed DD can be 10÷100 times better than the existing devices. Therefore, these DD are perspective for cryogenic electronics, and their preparation is a problem of today.  
</description>
</descriptions>
<formats>
<format>application/pdf</format>
</formats>
</resource>

Dublin Core

<?xml version='1.0' encoding='utf-8'?>
<oai_dc:dc xmlns:dc='http://purl.org/dc/elements/1.1/' xmlns:oai_dc='http://www.openarchives.org/OAI/2.0/oai_dc/' xmlns:xsi='http://www.w3.org/2001/XMLSchema-instance' xsi:schemaLocation='http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd'>
<dc:creator>Cherner, I.I.</dc:creator>
<dc:date>2006-12-05</dc:date>
<dc:description xml:lang='en'>The numerical calculations of the electrical potential distribution and current passing in 

the contacts of the high temperature superconductor (HTSC) with semiconductors silicon (Si) 
and indium antimonite (InSb) were carried out. There were analyzed the possibilities to prepare the diode detectors (DD) based on these contacts and working at liquid nitrogen temperature 77.4K.  
The comparison of structures based on Si and InSb was carried out. The obtained results 
were explained taking into account the physical properties of these semiconductors. Both advantages and disadvantages of these materials were discussed. The optimum application 
spheres were determined for Si and InSb accordingly.  
The comparison of the obtained results with existent literature data shows that the proposed DD can be 10÷100 times better than the existing devices. Therefore, these DD are perspective for cryogenic electronics, and their preparation is a problem of today.  
</dc:description>
<dc:source>Moldavian Journal of the Physical Sciences 5 (3-4) 360-365</dc:source>
<dc:title>HTSC – Si and HTSC – InSb contacts for diode detectors: comparison of characteristics 
</dc:title>
<dc:type>info:eu-repo/semantics/article</dc:type>
</oai_dc:dc>

        

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CHERNER, Iacov. HTSC – Si and HTSC – InSb contacts for diode detectors: comparison of characteristics . In: Moldavian Journal of the Physical Sciences. 2006, nr. 3-4(5), pp. 360-365. ISSN 1810-648X.

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