Deep gallium-induced defect states in Pb1-xSnxTe
Authors:
Skipetrov, E.; Zvereva, E.; Dmitriev, N.; Golubev, A.; Sliniko, V.
Summary:
The galvanomagnetic effects in Pb1-xSnxTe: Ga under variation of alloy composition were
investigated. It was found for samples with tin content x≤0.06 the temperature dependences of
resistivity and the Hall coefficient have a low temperature activation range of impurity ionization,
while for samples with 0.09≤x≤0.21 they have a “metallic” character. The results were discussed
assuming an appearance of two different deep impurity levels EGa1 and EGa stabilizing the Fermi
level in the energy spectrum. The activation energy for “insulating” samples as well as the Fermi
level position for “metallic” samples were determined and used to build the energy level diagram.
Export Metadata
Google Scholar
<meta name="citation_title" content="Deep gallium-induced defect states in Pb1-xSnxTe"> <meta name="citation_author" content="Skipetrov, E."> <meta name="citation_author" content="Zvereva, E."> <meta name="citation_author" content="Dmitriev, N."> <meta name="citation_author" content="Golubev, A."> <meta name="citation_author" content="Sliniko, V."> <meta name="citation_publication_date" content="2006/01/05"> <meta name="citation_journal_title" content="Moldavian Journal of the Physical Sciences"> <meta name="citation_volume" content="5"> <meta name="citation_issue" content="1"> <meta name="citation_firstpage" content="32"> <meta name="citation_lastpage" content="36"> <meta name="citation_pdf_url" content="https://ibn.idsi.md/sites/default/files/imag_file/Deep%20gallium_induced%20defect%20states%20in%20Pb1_xSnxTe.pdf">
Crossref
<?xml version='1.0' encoding='utf-8'?> <doi_batch version='4.3.7' xmlns='http://www.crossref.org/schema/4.3.7' xmlns:xsi='http://www.w3.org/2001/XMLSchema-instance' xsi:schemaLocation='http://www.crossref.org/schema/4.3.7 http://www.crossref.org/schema/deposit/crossref4.3.7.xsd'> <head> <doi_batch_id>ibn-3413</doi_batch_id> <timestamp>1597499689</timestamp> <depositor> <depositor_name>Information Society Development Instiute, Republic of Moldova</depositor_name> <email_address>mjps@nanotech.md</email_address> </depositor> <registrant>Institutul de Inginerie Electronică şi Nanotehnologii "D. Ghiţu" al AŞM</registrant> </head> <body> <journal> <journal_metadata> <full_title>Moldavian Journal of the Physical Sciences</full_title> <issn media_type='print'>1810648X</issn> </journal_metadata> <journal_issue> <publication_date media_type='print'> <year>2006</year> </publication_date> <issue>1(5)</issue> </journal_issue> <journal_article publication_type='full_text'><titles> <title>Deep gallium-induced defect states in Pb1-xSnxTe</title> </titles> <contributors> <person_name sequence='first' contributor_role='author'> <given_name>E.</given_name> <surname>Skipetrov</surname> </person_name> <person_name sequence='additional' contributor_role='author'> <given_name>E.</given_name> <surname>Zvereva</surname> </person_name> <person_name sequence='additional' contributor_role='author'> <given_name>N.</given_name> <surname>Dmitriev</surname> </person_name> <person_name sequence='additional' contributor_role='author'> <given_name>A.</given_name> <surname>Golubev</surname> </person_name> <person_name sequence='additional' contributor_role='author'> <given_name>V.</given_name> <surname>Sliniko</surname> </person_name> </contributors> <publication_date media_type='print'> <year>2006</year> </publication_date> <pages> <first_page>32</first_page> <last_page>36</last_page> </pages> </journal_article> </journal> </body> </doi_batch>
CERIF
<?xml version='1.0' encoding='utf-8'?> <CERIF xmlns='urn:xmlns:org:eurocris:cerif-1.5-1' xsi:schemaLocation='urn:xmlns:org:eurocris:cerif-1.5-1 http://www.eurocris.org/Uploads/Web%20pages/CERIF-1.5/CERIF_1.5_1.xsd' xmlns:xsi='http://www.w3.org/2001/XMLSchema-instance' release='1.5' date='2012-10-07' sourceDatabase='Output Profile'> <cfResPubl> <cfResPublId>ibn-ResPubl-3413</cfResPublId> <cfResPublDate>2006-01-05</cfResPublDate> <cfVol>5</cfVol> <cfIssue>1</cfIssue> <cfStartPage>32</cfStartPage> <cfISSN>1810-648X</cfISSN> <cfURI>http://mjps.utm.md/archive/2006/article/3413</cfURI> <cfTitle cfLangCode='RO' cfTrans='o'>Deep gallium-induced defect states in Pb1-xSnxTe</cfTitle> <cfAbstr cfLangCode='EN' cfTrans='o'>The galvanomagnetic effects in Pb1-xSnxTe: Ga under variation of alloy composition were investigated. It was found for samples with tin content x≤0.06 the temperature dependences of resistivity and the Hall coefficient have a low temperature activation range of impurity ionization, while for samples with 0.09≤x≤0.21 they have a “metallic” character. The results were discussed assuming an appearance of two different deep impurity levels EGa1 and EGa stabilizing the Fermi level in the energy spectrum. The activation energy for “insulating” samples as well as the Fermi level position for “metallic” samples were determined and used to build the energy level diagram. </cfAbstr> <cfResPubl_Class> <cfClassId>eda2d9e9-34c5-11e1-b86c-0800200c9a66</cfClassId> <cfClassSchemeId>759af938-34ae-11e1-b86c-0800200c9a66</cfClassSchemeId> <cfStartDate>2006-01-05T24:00:00</cfStartDate> </cfResPubl_Class> <cfResPubl_Class> <cfClassId>e601872f-4b7e-4d88-929f-7df027b226c9</cfClassId> <cfClassSchemeId>40e90e2f-446d-460a-98e5-5dce57550c48</cfClassSchemeId> <cfStartDate>2006-01-05T24:00:00</cfStartDate> </cfResPubl_Class> <cfPers_ResPubl> <cfPersId>ibn-person-35114</cfPersId> <cfClassId>49815870-1cfe-11e1-8bc2-0800200c9a66</cfClassId> <cfClassSchemeId>b7135ad0-1d00-11e1-8bc2-0800200c9a66</cfClassSchemeId> <cfStartDate>2006-01-05T24:00:00</cfStartDate> </cfPers_ResPubl> <cfPers_ResPubl> <cfPersId>ibn-person-35115</cfPersId> <cfClassId>49815870-1cfe-11e1-8bc2-0800200c9a66</cfClassId> <cfClassSchemeId>b7135ad0-1d00-11e1-8bc2-0800200c9a66</cfClassSchemeId> <cfStartDate>2006-01-05T24:00:00</cfStartDate> </cfPers_ResPubl> <cfPers_ResPubl> <cfPersId>ibn-person-35116</cfPersId> <cfClassId>49815870-1cfe-11e1-8bc2-0800200c9a66</cfClassId> <cfClassSchemeId>b7135ad0-1d00-11e1-8bc2-0800200c9a66</cfClassSchemeId> <cfStartDate>2006-01-05T24:00:00</cfStartDate> </cfPers_ResPubl> <cfPers_ResPubl> <cfPersId>ibn-person-35117</cfPersId> <cfClassId>49815870-1cfe-11e1-8bc2-0800200c9a66</cfClassId> <cfClassSchemeId>b7135ad0-1d00-11e1-8bc2-0800200c9a66</cfClassSchemeId> <cfStartDate>2006-01-05T24:00:00</cfStartDate> </cfPers_ResPubl> <cfPers_ResPubl> <cfPersId>ibn-person-35118</cfPersId> <cfClassId>49815870-1cfe-11e1-8bc2-0800200c9a66</cfClassId> <cfClassSchemeId>b7135ad0-1d00-11e1-8bc2-0800200c9a66</cfClassSchemeId> <cfStartDate>2006-01-05T24:00:00</cfStartDate> </cfPers_ResPubl> </cfResPubl> <cfPers> <cfPersId>ibn-Pers-35114</cfPersId> <cfPersName_Pers> <cfPersNameId>ibn-PersName-35114-2</cfPersNameId> <cfClassId>55f90543-d631-42eb-8d47-d8d9266cbb26</cfClassId> <cfClassSchemeId>7375609d-cfa6-45ce-a803-75de69abe21f</cfClassSchemeId> <cfStartDate>2006-01-05T24:00:00</cfStartDate> <cfFamilyNames>Skipetrov</cfFamilyNames> <cfFirstNames>E.</cfFirstNames> </cfPersName_Pers> </cfPers> <cfPers> <cfPersId>ibn-Pers-35115</cfPersId> <cfPersName_Pers> <cfPersNameId>ibn-PersName-35115-2</cfPersNameId> <cfClassId>55f90543-d631-42eb-8d47-d8d9266cbb26</cfClassId> <cfClassSchemeId>7375609d-cfa6-45ce-a803-75de69abe21f</cfClassSchemeId> <cfStartDate>2006-01-05T24:00:00</cfStartDate> <cfFamilyNames>Zvereva</cfFamilyNames> <cfFirstNames>E.</cfFirstNames> </cfPersName_Pers> </cfPers> <cfPers> <cfPersId>ibn-Pers-35116</cfPersId> <cfPersName_Pers> <cfPersNameId>ibn-PersName-35116-2</cfPersNameId> <cfClassId>55f90543-d631-42eb-8d47-d8d9266cbb26</cfClassId> <cfClassSchemeId>7375609d-cfa6-45ce-a803-75de69abe21f</cfClassSchemeId> <cfStartDate>2006-01-05T24:00:00</cfStartDate> <cfFamilyNames>Dmitriev</cfFamilyNames> <cfFirstNames>N.</cfFirstNames> </cfPersName_Pers> </cfPers> <cfPers> <cfPersId>ibn-Pers-35117</cfPersId> <cfPersName_Pers> <cfPersNameId>ibn-PersName-35117-2</cfPersNameId> <cfClassId>55f90543-d631-42eb-8d47-d8d9266cbb26</cfClassId> <cfClassSchemeId>7375609d-cfa6-45ce-a803-75de69abe21f</cfClassSchemeId> <cfStartDate>2006-01-05T24:00:00</cfStartDate> <cfFamilyNames>Golubev</cfFamilyNames> <cfFirstNames>A.</cfFirstNames> </cfPersName_Pers> </cfPers> <cfPers> <cfPersId>ibn-Pers-35118</cfPersId> <cfPersName_Pers> <cfPersNameId>ibn-PersName-35118-2</cfPersNameId> <cfClassId>55f90543-d631-42eb-8d47-d8d9266cbb26</cfClassId> <cfClassSchemeId>7375609d-cfa6-45ce-a803-75de69abe21f</cfClassSchemeId> <cfStartDate>2006-01-05T24:00:00</cfStartDate> <cfFamilyNames>Sliniko</cfFamilyNames> <cfFirstNames>V.</cfFirstNames> </cfPersName_Pers> </cfPers> </CERIF>
BibTeX
@article{ibn_3413,
author = {Skipetrov, E.P. and Zvereva, E.A. and Dmitriev, N.N. and Golubev, A.V. and Sliniko, V.E.},
title = {Deep gallium-induced defect states in Pb1-xSnxTe},
journal = {Moldavian Journal of the Physical Sciences},
year = {2006},
volume = {5 (1)},
pages = {32-36},
month = {Jan},
abstract = {(EN) The galvanomagnetic effects in Pb1-xSnxTe: Ga under variation of alloy composition were
investigated. It was found for samples with tin content x≤0.06 the temperature dependences of
resistivity and the Hall coefficient have a low temperature activation range of impurity ionization,
while for samples with 0.09≤x≤0.21 they have a “metallic” character. The results were discussed
assuming an appearance of two different deep impurity levels EGa1 and EGa stabilizing the Fermi
level in the energy spectrum. The activation energy for “insulating” samples as well as the Fermi
level position for “metallic” samples were determined and used to build the energy level diagram. },
url = {https://ibn.idsi.md/vizualizare_articol/3413},
}
DataCite
<?xml version='1.0' encoding='utf-8'?> <resource xmlns:xsi='http://www.w3.org/2001/XMLSchema-instance' xmlns='http://datacite.org/schema/kernel-3' xsi:schemaLocation='http://datacite.org/schema/kernel-3 http://schema.datacite.org/meta/kernel-3/metadata.xsd'> <creators> <creator> <creatorName>Skipetrov, E.P.</creatorName> </creator> <creator> <creatorName>Zvereva, E.A.</creatorName> </creator> <creator> <creatorName>Dmitriev, N.N.</creatorName> </creator> <creator> <creatorName>Golubev, A.V.</creatorName> </creator> <creator> <creatorName>Sliniko, V.E.</creatorName> </creator> </creators> <titles> <title xml:lang='ro'>Deep gallium-induced defect states in Pb1-xSnxTe</title> </titles> <publisher>Instrumentul Bibliometric National</publisher> <publicationYear>2006</publicationYear> <relatedIdentifier relatedIdentifierType='ISSN' relationType='IsPartOf'>1810-648X</relatedIdentifier> <dates> <date dateType='Issued'>2006-01-05</date> </dates> <resourceType resourceTypeGeneral='Text'>Journal article</resourceType> <descriptions> <description xml:lang='en' descriptionType='Abstract'>The galvanomagnetic effects in Pb1-xSnxTe: Ga under variation of alloy composition were investigated. It was found for samples with tin content x≤0.06 the temperature dependences of resistivity and the Hall coefficient have a low temperature activation range of impurity ionization, while for samples with 0.09≤x≤0.21 they have a “metallic” character. The results were discussed assuming an appearance of two different deep impurity levels EGa1 and EGa stabilizing the Fermi level in the energy spectrum. The activation energy for “insulating” samples as well as the Fermi level position for “metallic” samples were determined and used to build the energy level diagram. </description> </descriptions> <formats> <format>application/pdf</format> </formats> </resource>
Dublin Core
<?xml version='1.0' encoding='utf-8'?> <oai_dc:dc xmlns:dc='http://purl.org/dc/elements/1.1/' xmlns:oai_dc='http://www.openarchives.org/OAI/2.0/oai_dc/' xmlns:xsi='http://www.w3.org/2001/XMLSchema-instance' xsi:schemaLocation='http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd'> <dc:creator>Skipetrov, E.P.</dc:creator> <dc:creator>Zvereva, E.A.</dc:creator> <dc:creator>Dmitriev, N.N.</dc:creator> <dc:creator>Golubev, A.V.</dc:creator> <dc:creator>Sliniko, V.E.</dc:creator> <dc:date>2006-01-05</dc:date> <dc:description xml:lang='en'>The galvanomagnetic effects in Pb1-xSnxTe: Ga under variation of alloy composition were investigated. It was found for samples with tin content x≤0.06 the temperature dependences of resistivity and the Hall coefficient have a low temperature activation range of impurity ionization, while for samples with 0.09≤x≤0.21 they have a “metallic” character. The results were discussed assuming an appearance of two different deep impurity levels EGa1 and EGa stabilizing the Fermi level in the energy spectrum. The activation energy for “insulating” samples as well as the Fermi level position for “metallic” samples were determined and used to build the energy level diagram. </dc:description> <dc:source>Moldavian Journal of the Physical Sciences 5 (1) 32-36</dc:source> <dc:title>Deep gallium-induced defect states in Pb1-xSnxTe</dc:title> <dc:type>info:eu-repo/semantics/article</dc:type> </oai_dc:dc>